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Yield and Reliability in Microwave Circuit and System Design - Hardcover

Yield and Reliability in Microwave Circuit and System Design - Hardcover

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by Michael D. Meehan (Author), John Purviance (Joint Author), Michael D. Meehan (Preface by)

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Number of Pages: 300
Dimensions: 0.84 x 9.34 x 6.25 IN
Illustrated: Yes
Publication Date: December 19, 1993
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