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Characterization, Testing, Measurement, and Metrology - Paperback

Characterization, Testing, Measurement, and Metrology - Paperback

Regular price $157.44 USD
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by Chander Prakash (Editor), Sunpreet Singh (Editor), J. Paulo Davim (Editor)

As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.

Author Biography

Chander Prakash, Sunpreet Singh, J. Paulo Davim

Number of Pages: 192
Dimensions: 0.44 x 9.21 x 6.14 IN
Illustrated: Yes
Publication Date: October 04, 2024
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