Skip to product information
1 of 1

Advanced Machine Learning and Deep Learning Approaches for Remote Sensing II - Hardcover

Advanced Machine Learning and Deep Learning Approaches for Remote Sensing II - Hardcover

Regular price $147.88 USD
Regular price Sale price $147.88 USD
Sale Sold out
Shipping calculated at checkout.

Shipping: $8.00 or FREE when you spend $100+

Quantity

by Gwanggil Jeon (Guest Editor)

This publication elucidates the application of advanced technologies, including machine learning and deep learning, rooted in artificial intelligence, to the realm of remote sensing. It delineates the methodology employed to address prevailing challenges associated with the processing of images and image signals in remote sensing contexts. These methodologies are inherently computation-intensive, necessitating the utilization of high-performance computing apparatus, notably GPUs. With the evolution of such computational devices, alongside advancements in remote and aerial sensing technologies, it has become feasible to conduct Earth monitoring through high-definition imagery and to amass extensive datasets pertaining to Earth observations. The scholarly articles contained within this reprint detail the latest progress in the domains of big data processing and the employment of artificial intelligence-based techniques for enhancing remote sensing technologies.

Number of Pages: 336
Dimensions: 1.06 x 9.61 x 6.69 IN
Publication Date: April 10, 2024
View full details