{"product_id":"secondary-ion-mass-spectrometry-applications-for-depth-profiling-and-surface-characterization-paperback","title":"Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization - Paperback","description":"\u003cdiv\u003e\u003cp style=\"text-align: right;\"\u003e\u003ca href=\"https:\/\/reportcopyrightinfringement.com\/\" target=\"_blank\" rel=\"nofollow\"\u003e\u003cb\u003eReport copyright infringement\u003c\/b\u003e\u003c\/a\u003e\u003c\/p\u003e\u003c\/div\u003e\u003cp\u003eby \u003cb\u003eFred Stevie\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eThis book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.\u003c\/p\u003e\u003ch3\u003eAuthor Biography\u003c\/h3\u003e\u003cp\u003eSenior Researcher, North Carolina State University\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 277\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.61 x 9 x 6 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e September 15, 2015\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":47688041791709,"sku":"9781606505885","price":103.62,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0811\/9867\/8237\/files\/TkZvbUUzN3l3eHpvS2NkRjNKNWhQZz09.webp?v=1774045211","url":"https:\/\/handfulofbooks.com\/products\/secondary-ion-mass-spectrometry-applications-for-depth-profiling-and-surface-characterization-paperback","provider":"Handful of Books","version":"1.0","type":"link"}