{"product_id":"scaling-effects-on-metal-oxide-semiconductor-device-characteristics-hardcover","title":"Scaling Effects on Metal-oxide-semiconductor Device Characteristics - Hardcover","description":"\u003cdiv\u003e\u003cp style=\"text-align: right;\"\u003e\u003ca href=\"https:\/\/reportcopyrightinfringement.com\/\" target=\"_blank\" rel=\"nofollow\"\u003e\u003cb\u003eReport copyright infringement\u003c\/b\u003e\u003c\/a\u003e\u003c\/p\u003e\u003c\/div\u003e\u003cp\u003eby \u003cb\u003eSteven Walstra\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eDissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, \"Scaling Effects on Metal-oxide-semiconductor Device Characteristics\" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 152\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.38 x 11 x 8.5 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e July 21, 2019\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":47842574336221,"sku":"9780530002330","price":144.63,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0811\/9867\/8237\/files\/wZMmL7fUoy9780530002330.webp?v=1776985101","url":"https:\/\/handfulofbooks.com\/products\/scaling-effects-on-metal-oxide-semiconductor-device-characteristics-hardcover","provider":"Handful of Books","version":"1.0","type":"link"}